Study of Schottky contact between Au and NiO nanowire by conductive atomic force microscopy (C-AFM): The case of surface states
書誌事項
- 公開日
- 2015-05
- 権利情報
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- https://www.elsevier.com/tdm/userlicense/1.0/
- DOI
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- 10.1016/j.physe.2015.01.029
- 公開者
- Elsevier BV
この論文をさがす
収録刊行物
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- Physica E: Low-dimensional Systems and Nanostructures
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Physica E: Low-dimensional Systems and Nanostructures 69 109-114, 2015-05
Elsevier BV