Effects of well thickness and Si doping on the optical properties of GaN/AlGaN multiple quantum wells
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- K. C. Zeng
- Department of Physics, Kansas State University, Manhattan, Kansas 66506-2601
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- J. Y. Lin
- Department of Physics, Kansas State University, Manhattan, Kansas 66506-2601
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- H. X. Jiang
- Department of Physics, Kansas State University, Manhattan, Kansas 66506-2601
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- A. Salvador
- Materials Research Laboratory and Coordinated Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801
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- G. Popovici
- Materials Research Laboratory and Coordinated Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801
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- H. Tang
- Materials Research Laboratory and Coordinated Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801
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- W. Kim
- Materials Research Laboratory and Coordinated Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801
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- H. Morkoç
- Materials Research Laboratory and Coordinated Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801
説明
<jats:p>Effects of well thickness and Si doping on the optical properties of GaN/AlGaN (MQWs) have been investigated by picosecond time-resolved photoluminescence (PL) measurements. Our results have yielded that (i) the optical transitions in nominally undoped MQWs with narrow well thicknesses (Lw<40 Å) were blue shifted with respect to the GaN epilayer due to quantum confinement, however, no such blue shift was evident for the MQWs with well thicknesses larger than 40 Å, (ii) the band-to-impurity transitions were the dominant emission lines in nominally undoped MQWs of large well thicknesses (Lw>40 Å) at low temperatures, and (iii) Si doping improved significantly the crystalline quality of MQWs of large well thicknesses (Lw>40 Å). The implications of these results on the device applications based on III-nitride MQWs have been discussed.</jats:p>
収録刊行物
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- Applied Physics Letters
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Applied Physics Letters 71 (10), 1368-1370, 1997-09-08
AIP Publishing
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詳細情報 詳細情報について
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- CRID
- 1362262943326603520
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- DOI
- 10.1063/1.119896
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- ISSN
- 10773118
- 00036951
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- データソース種別
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- Crossref