Synchrotron high energy X-ray diffraction study of microstructure evolution of severely cold drawn NiTi wire during annealing
書誌事項
- 公開日
- 2016-08
- 権利情報
-
- https://www.elsevier.com/tdm/userlicense/1.0/
- https://www.elsevier.com/legal/tdmrep-license
- http://www.elsevier.com/open-access/userlicense/1.0/
- DOI
-
- 10.1016/j.actamat.2016.05.039
- 公開者
- Elsevier BV
この論文をさがす
収録刊行物
-
- Acta Materialia
-
Acta Materialia 115 35-44, 2016-08
Elsevier BV
