Can the incident photo-to-electron conversion efficiency be used to calculate short-circuit current density of dye-sensitized solar cells
書誌事項
- 公開日
- 2012-09
- 権利情報
-
- https://www.elsevier.com/tdm/userlicense/1.0/
- https://www.elsevier.com/legal/tdmrep-license
- DOI
-
- 10.1016/j.cap.2011.03.060
- 公開者
- Elsevier BV
この論文をさがす
収録刊行物
-
- Current Applied Physics
-
Current Applied Physics 12 e54-e58, 2012-09
Elsevier BV
