A Multiscale Modeling of Triple-Heterojunction Tunneling FETs

DOI PDF PDF 1 Citations

Journal

IEEE Transactions on Electron Devices

IEEE Transactions on Electron Devices 64 (6), 2728-2735, 2017-06

Institute of Electrical and Electronics Engineers (IEEE)

Citations (1)*help

See more

Details 詳細情報について

CRID

1362262943906656512
DOI

10.1109/ted.2017.2690669
ISSN

15579646

00189383
Web Site

http://ieeexplore.ieee.org/ielaam/16/7929292/7898786-aam.pdf

http://xplorestaging.ieee.org/ielx7/16/7929292/07898786.pdf?arnumber=7898786
Data Source
- Crossref

Export

Report a problem

Back to top