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- C. Welnak
- Center for X-ray Lithography, University of Wisconsin–Madison, 3731 Schneider Drive, Stoughton, Wisconsin 53589
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- P. Anderson
- Center for X-ray Lithography, University of Wisconsin–Madison, 3731 Schneider Drive, Stoughton, Wisconsin 53589
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- M. Khan
- Center for X-ray Lithography, University of Wisconsin–Madison, 3731 Schneider Drive, Stoughton, Wisconsin 53589
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- S. Singh
- Center for X-ray Lithography, University of Wisconsin–Madison, 3731 Schneider Drive, Stoughton, Wisconsin 53589
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- F. Cerrina
- Center for X-ray Lithography, University of Wisconsin–Madison, 3731 Schneider Drive, Stoughton, Wisconsin 53589
抄録
<jats:p>SHADOW is the ray-tracing program of choice for the synchrotron radiation community. The program can raytrace essentially any x-ray optical system and predict image shapes and intensities with great accuracy. Several new extensions have been included. The optical database has been extended to the 10-eV region by inclusion of the new data from the Center for X-ray Optics, Lawrence Berkeley Lab. Two major physical models have been added to the code; the first being a surface roughness model to add to the error surface option. The second addition is to the crystal model. It now includes an asymmetric crystal, a model of a mosaic crystal, and a model for the Johannson case of a figured, bent crystal. Until now, SHADOW has operated under Digital Equipment Corporation’s (DEC) VMS operating system (VMS). The advent of powerful RISC workstations has prompted a porting to the UNIX environment, opening a multiplatform operability. So far, the code has been validated for Ultrix (DEC) and is undergoing beta testing for Sun operating system and IBM Corporation’s AIX operating system. Porting to a 386/486 platform is also considered. Finally, an optimization algorithm based on a combination of the Simplex and simulated annealing is being implemented.</jats:p>
収録刊行物
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- Review of Scientific Instruments
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Review of Scientific Instruments 63 (1), 865-868, 1992-01-01
AIP Publishing
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詳細情報 詳細情報について
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- CRID
- 1362262944143204736
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- NII論文ID
- 30015953788
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- ISSN
- 10897623
- 00346748
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- データソース種別
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- Crossref
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