Crystal structure and thermal expansion of α-quartz SiO2 at low temperatures

DOI PDF 被引用文献13件
  • G. A. Lager
    Department of Geology, University of Louisville, Louisville, Kentucky 40292
  • J. D. Jorgensen
    Solid State Science Division, Argonne National Laboratory, Argonne, Illinois 60439
  • F. J. Rotella
    Solid State Science Division, Argonne National Laboratory, Argonne, Illinois 60439

書誌事項

公開日
1982-10-01
DOI
  • 10.1063/1.330062
公開者
AIP Publishing

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説明

<jats:p>The crystal structure of α-SiO2 (low quartz) has been refined at 296, 78, and 13 K from time-of-flight neutron powder diffraction data. The major effect of temperature from 296 to 78 K is a nearly rigid body rotation of the SiO4 tetrahedra. Below 78 K, tetrahedral rotation is substantially reduced giving rise to a much smaller thermal expansion. A comparison of the volume dependence of the Si-O-Si angle, the rotation angle for SiO4 tetrahedra and the c/a ratio suggests that the mechanism for expansion may be changing from tetrahedral rotation to tetrahedral distortion at the lowest temperatures. The inverse linear relation between the mean Si-O bond distance and −sec(Si-O-Si) which has been observed for silica minerals at both ambient and high-temperature conditions appears to be consistent with the structural variations that occur at low temperatures.</jats:p>

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