STEM moiré analysis for 2D strain measurements

DOI PDF 6 Citations

Journal

Journal of Electron Microscopy

Journal of Electron Microscopy 66 (3), 217-221, 2017-02-24

Oxford University Press (OUP)

Citations (6)*help

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Details 詳細情報について

CRID

1362262944189778816
DOI

10.1093/jmicro/dfx009
ISSN

14779986

00220744
Web Site

http://academic.oup.com/jmicro/article-pdf/66/3/217/17633639/dfx009.pdf
Data Source
- Crossref

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