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- R. LÜTHI
- Institute of Physics, University of Basel, Klingelbergstrasse 82, CH-4056 Basel, Switzerland
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- E. MEYER
- Institute of Physics, University of Basel, Klingelbergstrasse 82, CH-4056 Basel, Switzerland
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- M. BAMMERLIN
- Institute of Physics, University of Basel, Klingelbergstrasse 82, CH-4056 Basel, Switzerland
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- A. BARATOFF
- Institute of Physics, University of Basel, Klingelbergstrasse 82, CH-4056 Basel, Switzerland
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- L. HOWALD
- Institute of Physics, University of Basel, Klingelbergstrasse 82, CH-4056 Basel, Switzerland
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- CH. GERBER
- IBM Research Laboratory Zurich, Switzerland
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- H.-J. GÜNTHERODT
- Institute of Physics, University of Basel, Klingelbergstrasse 82, CH-4056 Basel, Switzerland
書誌事項
- 公開日
- 1997-10
- DOI
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- 10.1142/s0218625x9700122x
- 公開者
- World Scientific Pub Co Pte Lt
この論文をさがす
説明
<jats:p> In this note we report the first observation of salient features of the Si(111)(7×7) reconstructed surface across monatomic steps by dynamic atomic force microscopy (AFM) in ultrahigh vacuum (UHV). Simultaneous measurements of the resonance frequency shift Δf of the Si cantilever and of the mean tunneling current [Formula: see text] from the cleaned Si tip indicate a restricted range for stable imaging with true atomic resolution. The corresponding characteristics vs. distance reveal why feedback control via Δf is problematic, whereas it is as successful as in conventional STM via [Formula: see text]. Furthermore, local dissipation (energy loss of 10<jats:sup>-14</jats:sup> W) through individual atoms is observed and explained by the coupling of the surface atoms to phonons. </jats:p>
収録刊行物
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- Surface Review and Letters
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Surface Review and Letters 04 (05), 1025-1029, 1997-10
World Scientific Pub Co Pte Lt