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Mechanisms of Exchange Bias with Multiferroic<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:msub><mml:mi>BiFeO</mml:mi><mml:mn>3</mml:mn></mml:msub></mml:math>Epitaxial Thin Films
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Journal
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- Physical Review Letters
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Physical Review Letters 100 (1), 017204-, 2008-01-09
American Physical Society (APS)
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Details 詳細情報について
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- CRID
- 1362262945172237696
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- ISSN
- 10797114
- 00319007
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- Data Source
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- Crossref