X-ray refraction-enhanced imaging and a method for phase retrieval for a simple object
書誌事項
- 公開日
- 2002-04-25
- 権利情報
-
- http://journals.iucr.org/services/copyrightpolicy.html
- http://journals.iucr.org/services/copyrightpolicy.html#TDM
- DOI
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- 10.1107/s090904950200554x
- 公開者
- International Union of Crystallography (IUCr)
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説明
<jats:p>Refraction-enhanced imaging is now widely used for imaging low-absorption-contrast specimens in the hard X-ray region. However, the interpretation of the details of a refraction-enhanced image is not always clear. In this paper the theoretical treatment of refraction-enhanced imaging and a method for phase retrieval from refraction-contrast images are discussed in comparison with angular-deflection mapping of the transmitting beam. The problems of thick and complicated objects are also discussed.</jats:p>
収録刊行物
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- Journal of Synchrotron Radiation
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Journal of Synchrotron Radiation 9 (3), 160-165, 2002-04-25
International Union of Crystallography (IUCr)
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詳細情報 詳細情報について
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- CRID
- 1362262945936375168
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- ISSN
- 09090495
- https://id.crossref.org/issn/09090495
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- データソース種別
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- Crossref
