Domain wall motion and electromechanical strain in lead-free piezoelectrics: Insight from the model system (1 − x)Ba(Zr0.2Ti0.8)O3–x(Ba0.7Ca0.3)TiO3 using <i>in situ</i> high-energy X-ray diffraction during application of electric fields
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- Goknur Tutuncu
- Department of Materials Science and Engineering, University of Florida 1 , Gainesville, Florida 32611, USA
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- Binzhi Li
- Department of Chemical Engineering and Materials Science, University of California 2 , Davis, Davis, California 95616, USA
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- Keith Bowman
- Illinois Institute of Technology, Armour College of Engineering 3 , Chicago, Illinois 60616, USA
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- Jacob L. Jones
- Department of Materials Science and Engineering, North Carolina State University 5 , Raleigh, North Carolina 27695, USA
書誌事項
- 公開日
- 2014-04-09
- DOI
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- 10.1063/1.4870934
- 公開者
- AIP Publishing
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説明
<jats:p>The piezoelectric compositions (1 − x)Ba(Zr0.2Ti0.8)O3–x(Ba0.7Ca0.3)TiO3 (BZT-xBCT) span a model lead-free morphotropic phase boundary (MPB) between room temperature rhombohedral and tetragonal phases at approximately x = 0.5. In the present work, in situ X-ray diffraction measurements during electric field application are used to elucidate the origin of electromechanical strain in several compositions spanning the tetragonal compositional range 0.6 ≤ x ≤ 0.9. As BCT concentration decreases towards the MPB, the tetragonal distortion (given by c/a-1) decreases concomitantly with an increase in 90° domain wall motion. The increase in observed macroscopic strain is predominantly attributed to the increased contribution from 90° domain wall motion. The results demonstrate that domain wall motion is a significant factor in achieving high strain and piezoelectric coefficients in lead-free polycrystalline piezoelectrics.</jats:p>
収録刊行物
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- Journal of Applied Physics
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Journal of Applied Physics 115 (14), 144104-, 2014-04-09
AIP Publishing