Atomic-resolution transmission electron microscopy of electron beam–sensitive crystalline materials
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- Daliang Zhang
- King Abdullah University of Science and Technology (KAUST), Imaging and Characterization Core Lab, Thuwal 23955-6900, Saudi Arabia.
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- Yihan Zhu
- KAUST, Advanced Membranes and Porous Materials Center, Physical Sciences and Engineering Division, Thuwal 23955-6900, Saudi Arabia.
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- Lingmei Liu
- KAUST, Advanced Membranes and Porous Materials Center, Physical Sciences and Engineering Division, Thuwal 23955-6900, Saudi Arabia.
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- Xiangrong Ying
- KAUST, Advanced Membranes and Porous Materials Center, Physical Sciences and Engineering Division, Thuwal 23955-6900, Saudi Arabia.
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- Chia-En Hsiung
- KAUST, Advanced Membranes and Porous Materials Center, Physical Sciences and Engineering Division, Thuwal 23955-6900, Saudi Arabia.
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- Rachid Sougrat
- King Abdullah University of Science and Technology (KAUST), Imaging and Characterization Core Lab, Thuwal 23955-6900, Saudi Arabia.
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- Kun Li
- King Abdullah University of Science and Technology (KAUST), Imaging and Characterization Core Lab, Thuwal 23955-6900, Saudi Arabia.
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- Yu Han
- KAUST, Advanced Membranes and Porous Materials Center, Physical Sciences and Engineering Division, Thuwal 23955-6900, Saudi Arabia.
書誌事項
- 公開日
- 2018-02-09
- DOI
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- 10.1126/science.aao0865
- 公開者
- American Association for the Advancement of Science (AAAS)
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説明
<jats:title>Crystallography of sensitive materials</jats:title> <jats:p> High-resolution transmission electron microscopy is an invaluable tool for looking at the crystalline structures of many materials. However, the need for high beam doses, especially as a sample is rotated to find the crystal axes, can lead to damage, particularly in fragile materials. Zhang <jats:italic>et al.</jats:italic> combined a state-of-the-art direct-detection electron-counting camera with ways to limit the overall electron dose to analyze delicate materials such as metal organic frameworks. With this approach, they could see the benzene rings in a UiO-66 linker and the coexistence of ligand-free (metal-exposing) and ligand-capped surfaces in UiO-66 crystals. </jats:p> <jats:p> <jats:italic>Science</jats:italic> , this issue p. <jats:related-article xmlns:xlink="http://www.w3.org/1999/xlink" ext-link-type="doi" issue="6376" page="675" related-article-type="in-this-issue" vol="359" xlink:href="10.1126/science.aao0865">675</jats:related-article> </jats:p>
収録刊行物
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- Science
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Science 359 (6376), 675-679, 2018-02-09
American Association for the Advancement of Science (AAAS)
