-
- Q. Zhu
- Physics Department, Brookhaven National Laboratory, Upton, New York 11973
-
- A. Botchkarev
- Materials Research Laboratory and Coordinated Science Laboratory, University of Illinois, Urbana, Illinois 61801
-
- W. Kim
- Materials Research Laboratory and Coordinated Science Laboratory, University of Illinois, Urbana, Illinois 61801
-
- Ö. Aktas
- Materials Research Laboratory and Coordinated Science Laboratory, University of Illinois, Urbana, Illinois 61801
-
- A. Salvador
- Materials Research Laboratory and Coordinated Science Laboratory, University of Illinois, Urbana, Illinois 61801
-
- B. Sverdlov
- Materials Research Laboratory and Coordinated Science Laboratory, University of Illinois, Urbana, Illinois 61801
-
- H. Morkoç
- Materials Research Laboratory and Coordinated Science Laboratory, University of Illinois, Urbana, Illinois 61801
-
- S.-C. Y. Tsen
- Department of Physics and Astronomy and Center for Solid State Science, Arizona State University, Tempe, Arizona 85287
-
- David J. Smith
- Department of Physics and Astronomy and Center for Solid State Science, Arizona State University, Tempe, Arizona 85287
書誌事項
- 公開日
- 1996-02-19
- DOI
-
- 10.1063/1.115739
- 公開者
- AIP Publishing
この論文をさがす
説明
<jats:p>The structural characteristics of GaN films grown on sapphire substrates by molecular beam epitaxy have been investigated using high-resolution synchrotron x-ray diffraction and electron microscopy. We find remarkable correspondence between the in-plane structural order (coherence length and mosaic spread) and the electrical and optical properties. Contrary to common belief, our observations show unequivocally that the out-of-plane structural features, which are considerably better developed than the in-plane counterparts, cannot be used for determining the material quality with respect to their optical and electrical activity. In particular, the (00l) mosaic spread is not a good indicator of film quality.</jats:p>
収録刊行物
-
- Applied Physics Letters
-
Applied Physics Letters 68 (8), 1141-1143, 1996-02-19
AIP Publishing
- Tweet
詳細情報 詳細情報について
-
- CRID
- 1362262946322838784
-
- DOI
- 10.1063/1.115739
-
- ISSN
- 10773118
- 00036951
-
- データソース種別
-
- Crossref