Evaluated cross section and thick target yield data bases of Zn+p processes for practical applications

詳細情報 詳細情報について

• CRID

  1362262946406233344

• DOI

  10.1016/s0969-8043(97)10103-8

• ISSN

  09698043

• Web Site

  https://api.elsevier.com/content/article/PII:S0969804397101038?httpAccept=text/xml

  https://api.elsevier.com/content/article/PII:S0969804397101038?httpAccept=text/plain

• データソース種別

  • Crossref