An experimental comparison of multi-frequency and chirp excitations for eddy current testing on thin defects
Journal
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- Measurement
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Measurement 63 207-220, 2015-03
Elsevier BV
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Details 詳細情報について
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- CRID
- 1362262946406842368
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- ISSN
- 02632241
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- Data Source
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- Crossref