Defect Chemistry of Pr Doped Ceria Thin Films Investigated by <i>in Situ</i> Optical and Impedance Measurements
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- Harry L. Tuller
- International Institute of Carbon Neutral Energy Research, Kyushu University, Fukuoka 819-0395, Japan
書誌事項
- 公開日
- 2017-03-06
- DOI
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- 10.1021/acs.chemmater.6b03307
- 公開者
- American Chemical Society (ACS)
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説明
While oxygen defect equilibrium in functional oxide thin films has a strong impact on device performance and longevity, few methods exist for evaluating it in situ. In this study, simultaneous in situ optical transmission and electrochemical impedance spectroscopy measurements are demonstrated as powerful and convenient means for this purpose, utilizing PrxCe1–xO2−δ (PCO) with multiple oxidation states for Pr (3+ and 4+) as a model system. The Pr4+ color center optical absorptivity increased linearly with the Pr4+ concentration, each independently derived from optical and chemical capacitance measurements, respectively, at elevated temperatures (550–700 °C) and under controlled pO2 (10–4–1 atm), validating the use of optical absorption as a convenient means for monitoring defect concentrations and oxygen nonstoichiometry. The extracted extinction coefficient for Pr4+ (ePr4+ = 5.86 ± 0.12 × 10–18 cm2 with y-axis intercept of 927.5 ± 207.3 cm–1) can now be utilized to study defect equilibria of PCO, and by ...
収録刊行物
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- Chemistry of Materials
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Chemistry of Materials 29 (5), 1999-2007, 2017-03-06
American Chemical Society (ACS)
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詳細情報 詳細情報について
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- CRID
- 1362544418558733056
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- ISSN
- 15205002
- 08974756
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- データソース種別
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- Crossref
- OpenAIRE