Use of LEED Apparatus for the Detection and Identification of Surface Contaminants

DOI PDF 被引用文献7件
  • R. E. Weber
    Physical Electronics Laboratory, University of Minnesota, Minneapolis, Minnesota
  • W. T. Peria
    Physical Electronics Laboratory, University of Minnesota, Minneapolis, Minnesota

書誌事項

公開日
1967-10-01
DOI
  • 10.1063/1.1709128
公開者
AIP Publishing

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説明

<jats:p>A low-energy electron diffraction (LEED) system has been used to study the energy spectra of Auger electrons from clean and alkali-covered Ge and Si surfaces. Auger bands characteristic of the substrates were observed for the clean surfaces and the deposition of submonolayer coverages of K and Cs introduced new bands characteristic of the respective alkali. It is shown that a surface impurity in a quantity as small as 0.1 monolayer can be detected and identified by this measurement.</jats:p>

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