Ellipsometric study of refractive index anisotropy in porous silicon

DOI Web Site Web Site 1 Citations

Journal

Journal of Luminescence

Journal of Luminescence 80 (1-4), 183-186, 1998-12

Elsevier BV

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CRID

1362544418838272768
DOI

10.1016/s0022-2313(98)00093-3
ISSN

00222313
Web Site

https://api.elsevier.com/content/article/PII:S0022231398000933?httpAccept=text/xml

https://api.elsevier.com/content/article/PII:S0022231398000933?httpAccept=text/plain
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