Pump-probe Kelvin-probe force microscopy: Principle of operation and resolution limits

DOI PDF 6 Citations
  • J. Murawski
    Technische Universität Dresden Institute of Applied Physics, , D-01062 Dresden, Germany
  • T. Graupner
    Technische Universität Dresden Institute of Applied Physics, , D-01062 Dresden, Germany
  • P. Milde
    Technische Universität Dresden Institute of Applied Physics, , D-01062 Dresden, Germany
  • R. Raupach
    Technische Universität Dresden Institute of Applied Physics, , D-01062 Dresden, Germany
  • U. Zerweck-Trogisch
    Technische Universität Dresden Institute of Applied Physics, , D-01062 Dresden, Germany
  • L. M. Eng
    Technische Universität Dresden Institute of Applied Physics, , D-01062 Dresden, Germany

Description

<jats:p>Knowledge on surface potential dynamics is crucial for understanding the performance of modern-type nanoscale devices. We describe an electrical pump-probe approach in Kelvin-probe force microscopy that enables a quantitative measurement of dynamic surface potentials at nanosecond-time and nanometer-length scales. Also, we investigate the performance of pump-probe Kelvin-probe force microscopy with respect to the relevant experimental parameters. We exemplify a measurement on an organic field effect transistor that verifies the undisturbed functionality of our pump-probe approach in terms of simultaneous and quantitative mapping of topographic and electronic information at a high lateral and temporal resolution.</jats:p>

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