Measurement of Forbidden Energy Gap of Semiconductors by Diffuse Reflectance Technique

S. P. Tandon, J. P. Gupta

doi:10.1002/pssb.19700380136

Measurement of Forbidden Energy Gap of Semiconductors by Diffuse Reflectance Technique

DOI Web Site Web Site 被引用文献7件

書誌事項

公開日: 1970-01

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http://onlinelibrary.wiley.com/termsAndConditions#vor

DOI

10.1002/pssb.19700380136

公開者: Wiley

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<jats:title>Abstract</jats:title><jats:p>Diffuse reflectance technique for the measurement of forbidden energy gap, <jats:italic>E</jats:italic><jats:sub>g</jats:sub>, is discussed. The energy coordinate of the point at which the linear increase in the Kubelka‐Munk function starts gives the <jats:italic>E</jats:italic><jats:sub>g</jats:sub>‐value. The <jats:italic>E</jats:italic><jats:sub>g</jats:sub>‐values of fifteen semiconductors are reported. These <jats:italic>E</jats:italic><jats:sub>g</jats:sub>‐values are found to be in good agreement with those measured by other methods.</jats:p>