DeepLab: Semantic Image Segmentation with Deep Convolutional Nets, Atrous Convolution, and Fully Connected CRFs
Journal
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- IEEE Transactions on Pattern Analysis and Machine Intelligence
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IEEE Transactions on Pattern Analysis and Machine Intelligence 40 (4), 834-848, 2018-04-01
Institute of Electrical and Electronics Engineers (IEEE)
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Details 詳細情報について
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- CRID
- 1362544420595112448
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- ISSN
- 21609292
- 01628828
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- Data Source
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- Crossref