A study of the effect of degradation of the aluminium metallization layer in the case of power semiconductor devices
書誌事項
- 公開日
- 2011-09
- 権利情報
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- https://www.elsevier.com/tdm/userlicense/1.0/
- DOI
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- 10.1016/j.microrel.2011.06.009
- 公開者
- Elsevier BV
この論文をさがす
収録刊行物
-
- Microelectronics Reliability
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Microelectronics Reliability 51 (9-11), 1824-1829, 2011-09
Elsevier BV