Superior Retention of Low-Resistance State in Conductive Bridge Random Access Memory With Single Filament Formation
書誌事項
- 公開日
- 2015-02
- 権利情報
-
- https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html
- DOI
-
- 10.1109/led.2014.2379961
- 公開者
- Institute of Electrical and Electronics Engineers (IEEE)
この論文をさがす
収録刊行物
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- IEEE Electron Device Letters
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IEEE Electron Device Letters 36 (2), 129-131, 2015-02
Institute of Electrical and Electronics Engineers (IEEE)
