What Determines Inhomogeneous Linewidths in Semiconductor Microcavities?
書誌事項
- 公開日
- 1998-05-25
- 権利情報
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- http://link.aps.org/licenses/aps-default-license
- DOI
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- 10.1103/physrevlett.80.4791
- 10.48550/arxiv.cond-mat/9711290
- 公開者
- American Physical Society (APS)
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説明
Microcavity inhomogeneous line widths are calculated numerically using a microscopic two dimensional model of the polariton interaction with quantum well disorder. The calculations show show that in most structures the line widths are determined by disorder scattering between polariton and exciton states. This is because motional narrowing effectively removes the contribution due to multiple scattering between polariton states.
4 pages, Revtex, postscript figures input with epsf
収録刊行物
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- Physical Review Letters
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Physical Review Letters 80 (21), 4791-4794, 1998-05-25
American Physical Society (APS)
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詳細情報 詳細情報について
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- CRID
- 1362825893576099072
-
- ISSN
- 10797114
- 00319007
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- データソース種別
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- Crossref
- OpenAIRE

