Slide-seq: A scalable technology for measuring genome-wide expression at high spatial resolution
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- Samuel G. Rodriques
- Department of Physics, Massachusetts Institute of Technology, Cambridge, MA 02139, USA.
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- Robert R. Stickels
- Broad Institute of Harvard and MIT, Cambridge, MA 02142, USA.
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- Aleksandrina Goeva
- Broad Institute of Harvard and MIT, Cambridge, MA 02142, USA.
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- Carly A. Martin
- Broad Institute of Harvard and MIT, Cambridge, MA 02142, USA.
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- Evan Murray
- Broad Institute of Harvard and MIT, Cambridge, MA 02142, USA.
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- Charles R. Vanderburg
- Broad Institute of Harvard and MIT, Cambridge, MA 02142, USA.
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- Joshua Welch
- Broad Institute of Harvard and MIT, Cambridge, MA 02142, USA.
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- Linlin M. Chen
- Broad Institute of Harvard and MIT, Cambridge, MA 02142, USA.
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- Fei Chen
- Broad Institute of Harvard and MIT, Cambridge, MA 02142, USA.
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- Evan Z. Macosko
- Broad Institute of Harvard and MIT, Cambridge, MA 02142, USA.
Description
<jats:title>Gene expression at fine scale</jats:title> <jats:p> Mapping gene expression at the single-cell level within tissues remains a technical challenge. Rodriques <jats:italic>et al.</jats:italic> developed a method called Slide-seq, whereby RNA was spatially resolved from tissue sections by transfer onto a surface covered with DNA-barcoded beads. Applying Slide-seq to regions of a mouse brain revealed spatial gene expression patterns in the Purkinje layer of the cerebellum and axes of variation across Purkinje cell compartments. The authors used this method to dissect the temporal evolution of cell type–specific responses in a mouse model of traumatic brain injury. </jats:p> <jats:p> <jats:italic>Science</jats:italic> , this issue p. <jats:related-article xmlns:xlink="http://www.w3.org/1999/xlink" ext-link-type="doi" issue="6434" page="1463" related-article-type="in-this-issue" vol="363" xlink:href="10.1126/science.aaw1219">1463</jats:related-article> </jats:p>
Journal
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- Science
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Science 363 (6434), 1463-1467, 2019-03-29
American Association for the Advancement of Science (AAAS)
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Details 詳細情報について
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- CRID
- 1362825893599753088
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- ISSN
- 10959203
- 00368075
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- Data Source
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- Crossref
