Deep learning for FTIR histology: leveraging spatial and spectral features with convolutional neural networks
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- Sebastian Berisha
- Department of Electrical and Computer Engineering
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- Mahsa Lotfollahi
- Department of Electrical and Computer Engineering
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- Jahandar Jahanipour
- Department of Electrical and Computer Engineering
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- Ilker Gurcan
- Department of Electrical and Computer Engineering
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- Michael Walsh
- Department of Pathology
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- Rohit Bhargava
- Departments of Bioengineering
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- Hien Van Nguyen
- Department of Electrical and Computer Engineering
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- David Mayerich
- Department of Electrical and Computer Engineering
Description
<p>Infrared spectroscopy combined with deep learning provide an automated and quantitative alternative to traditional histological examination.</p>
Journal
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- The Analyst
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The Analyst 144 (5), 1642-1653, 2019
Royal Society of Chemistry (RSC)
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Details 詳細情報について
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- CRID
- 1362825893776177408
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- ISSN
- 13645528
- 00032654
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- Data Source
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- Crossref