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- Shiho Iwanaga
- California Institute of Technology Materials Science, , Pasadena, California 91125, USA
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- Eric S. Toberer
- California Institute of Technology Materials Science, , Pasadena, California 91125, USA
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- Aaron LaLonde
- California Institute of Technology Materials Science, , Pasadena, California 91125, USA
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- G. Jeffrey Snyder
- California Institute of Technology Materials Science, , Pasadena, California 91125, USA
書誌事項
- 公開日
- 2011-06-01
- DOI
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- 10.1063/1.3601358
- 公開者
- AIP Publishing
この論文をさがす
説明
<jats:p>A high temperature Seebeck coefficient measurement apparatus with various features to minimize typical sources of error is designed and built. Common sources of temperature and voltage measurement error are described and principles to overcome these are proposed. With these guiding principles, a high temperature Seebeck measurement apparatus with a uniaxial 4-point contact geometry is designed to operate from room temperature to over 1200 K. This instrument design is simple to operate, and suitable for bulk samples with a broad range of physical types and shapes.</jats:p>
収録刊行物
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- Review of Scientific Instruments
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Review of Scientific Instruments 82 (6), 063905-, 2011-06-01
AIP Publishing