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Ordinal Measures for Iris Recognition

DOI PDF 1 Citations

Journal

IEEE Transactions on Pattern Analysis and Machine Intelligence

IEEE Transactions on Pattern Analysis and Machine Intelligence 31 (12), 2211-2226, 2009-12

Institute of Electrical and Electronics Engineers (IEEE)

Citations (1)*help

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Details 詳細情報について

CRID

1362825894253436928
DOI

10.1109/tpami.2008.240
ISSN

01628828
Web Site

http://xplorestaging.ieee.org/ielx5/34/5291213/04641931.pdf?arnumber=4641931
Data Source
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