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- H. Dersch
- Fachbereich Physik, University of Marburg, Federal Republic of Germany
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- J. Stuke
- Fachbereich Physik, University of Marburg, Federal Republic of Germany
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- J. Beichler
- Fachbereich Physik, University of Marburg, Federal Republic of Germany
書誌事項
- 公開日
- 1981-03-15
- DOI
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- 10.1063/1.92402
- 公開者
- AIP Publishing
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説明
<jats:p>After intensive and long illumination of undoped a-Si:H samples the dark ESR signal is considerably enhanced. The g value of 2.0055 and the linewidth DHpp = 6–7 G leads to the conclusion that the light-induced defects are single dangling bonds. They disappear again by thermal anneal at about 220 °C.</jats:p>
収録刊行物
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- Applied Physics Letters
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Applied Physics Letters 38 (6), 456-458, 1981-03-15
AIP Publishing
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詳細情報 詳細情報について
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- CRID
- 1362825894298306560
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- DOI
- 10.1063/1.92402
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- ISSN
- 10773118
- 00036951
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- データソース種別
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- Crossref