The Gaussian-Lorentzian Sum, Product, and Convolution (Voigt) functions in the context of peak fitting X-ray photoelectron spectroscopy (XPS) narrow scans

Details 詳細情報について

• CRID

  1362825894536953344

• DOI

  10.1016/j.apsusc.2018.03.190

• ISSN

  01694332

• Web Site

  https://api.elsevier.com/content/article/PII:S0169433218308766?httpAccept=text/xml

  https://api.elsevier.com/content/article/PII:S0169433218308766?httpAccept=text/plain

• Data Source

  • Crossref