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- B. Q. Wei
- Department of Materials Science and Engineering, Rensselaer Polytechnic Institute, Troy, New York 12180
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- R. Vajtai
- Department of Materials Science and Engineering, Rensselaer Polytechnic Institute, Troy, New York 12180
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- P. M. Ajayan
- Department of Materials Science and Engineering, Rensselaer Polytechnic Institute, Troy, New York 12180
書誌事項
- 公開日
- 2001-08-20
- DOI
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- 10.1063/1.1396632
- 公開者
- AIP Publishing
この論文をさがす
説明
<jats:p>The current-carrying capacity and reliability studies of multiwalled carbon nanotubes under high current densities (>109 A/cm2) show that no observable failure in the nanotube structure and no measurable change in the resistance are detected at temperatures up to 250 °C and for time scales up to 2 weeks. Our results suggest that nanotubes are potential candidates as interconnects in future large-scale integrated nanoelectronic devices.</jats:p>
収録刊行物
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- Applied Physics Letters
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Applied Physics Letters 79 (8), 1172-1174, 2001-08-20
AIP Publishing