Fault Slip Rates at Depth from Recurrence Intervals of Repeating Microearthquakes
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- Robert M. Nadeau
- Earth Sciences Division, Lawrence Berkeley National Laboratory, and Berkeley Seismological Laboratory, University of California, Berkeley, CA 94720, USA.
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- Thomas V. McEvilly
- Earth Sciences Division, Lawrence Berkeley National Laboratory, and Berkeley Seismological Laboratory, University of California, Berkeley, CA 94720, USA.
書誌事項
- 公開日
- 1999-07-30
- DOI
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- 10.1126/science.285.5428.718
- 公開者
- American Association for the Advancement of Science (AAAS)
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説明
<jats:p>Unique attributes in sequences of recurring, similar microearthquakes at Parkfield, California, provide a means for inferring slip rate at depth throughout the active fault surface from the time intervals between sequence events. Application of the method using an 11-year microseismicity record revealed systematic spatial and temporal changes in the slip rate that were synchronous with earthquake activity and other independent measures of fault-zone slip. If this phenomenon is found to be generally common behavior in active faults, it forms the basis for a method to monitor the changing strain field throughout a seismogenic fault zone.</jats:p>
収録刊行物
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- Science
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Science 285 (5428), 718-721, 1999-07-30
American Association for the Advancement of Science (AAAS)
