The defect structure of thin oxide films on aluminum

詳細情報 詳細情報について

• CRID

  1362825895087647360

• NII論文ID

  30011782806

• DOI

  10.1007/bf00604998

• ISSN

  15734889

  0030770X

• Web Site

  http://link.springer.com/content/pdf/10.1007/BF00604998.pdf

  http://link.springer.com/article/10.1007/BF00604998/fulltext.html

  http://link.springer.com/content/pdf/10.1007/BF00604998

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