A model for the prediction of Nb/sub 3/Sn critical current as a function of field, temperature, strain, and radiation damage
書誌事項
- 公開日
- 1991-03
- 権利情報
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- https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html
- DOI
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- 10.1109/20.133608
- 公開者
- Institute of Electrical and Electronics Engineers (IEEE)
この論文をさがす
収録刊行物
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- IEEE Transactions on Magnetics
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IEEE Transactions on Magnetics 27 (2), 2041-2044, 1991-03
Institute of Electrical and Electronics Engineers (IEEE)