The spin-polarized scanning electron microscope observation of 0.1 μm marks recorded by magnetic field modulation on a magneto-optical recording disk

DOI PDF 被引用文献1件
  • Teruo Kohashi
    Advanced Research Laboratory, Hitachi, Ltd., Hatoyama, Saitama 350-03, Japan
  • Hideo Matsuyama
    Advanced Research Laboratory, Hitachi, Ltd., Hatoyama, Saitama 350-03, Japan
  • Kazuyuki Koike
    Advanced Research Laboratory, Hitachi, Ltd., Hatoyama, Saitama 350-03, Japan
  • Yoshiteru Murakami
    Precision Technology Development Center, Sharp Corporation, 2613-1, Ichinomoto-cho, Tenri, Nara 632, Japan
  • Yasuhito Tanaka
    Multimedia System R&D Division, Hitachi, Ltd. 1241, Yoshida-cho, Totsuka-ku, Yokohama, Kanagawa 244, Japan
  • Hiroyuki Awano
    Recording Media Research Laboratory, Hitachi Maxell Ltd., 6-20-1 Kinunodai, Yawara-mura, Tsukuba-gun, Ibaraki 300-24, Japan

抄録

<jats:p>The magneto-optically recorded marks with magnetic field modulation method were studied using spin-polarized scanning electron microscopy. We confirmed that marks with as short a length as 0.1 μm could be written repeatedly even with laser spot sizes about 1.2 μm. This mark length is less than 16 that of present commercial products.</jats:p>

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