Spectral Index for Quantifying Leaf Area Index of Winter Wheat by Field Hyperspectral Measurements: A Case Study in Gifu Prefecture, Central Japan

DOI Web Site 被引用文献2件 オープンアクセス
  • Shinya Tanaka
    Department of Forest Management, Forestry and Forest Products Research Institute, 1 Matsunosato, Tsukuba, Ibaraki 305-8687, Japan
  • Kensuke Kawamura
    Graduate School for International Development and Cooperation, Hiroshima University, 1-5-1 Kagamiyama, Higashi-Hiroshima 739-8529, Japan
  • Masayasu Maki
    Faculty of Engineering, Tohoku Institute of Technology, 35-1, YagiyamaKasumi-cho, Taihaku-ku, Sendai, Miyagi 982-8577, Japan
  • Yasunori Muramoto
    Gifu Prefectural Agricultural Technology Center, 729-1 Matamaru, Gifu 501-1152, Japan
  • Kazuaki Yoshida
    Gifu Region Agriculture and Forestry Office, 5-14-53 YabutaMinami, Gifu 500-8384, Japan
  • Tsuyoshi Akiyama
    River Basin Research Center, Gifu University, 1-1 Yanagido, Gifu 501-1193, Japan

書誌事項

公開日
2015-04-27
権利情報
  • https://creativecommons.org/licenses/by/4.0/
DOI
  • 10.3390/rs70505329
公開者
MDPI AG

説明

<jats:p>Timely and nondestructive monitoring of leaf area index (LAI) using remote sensing techniques is crucial for precise and efficient management of crops. In this paper, a new spectral index (SI) for estimating LAI of winter wheat (Triticum aestivum L.) is proposed on the basis of field hyperspectral measurements. A simple index based on the empirical relationships between LAIs and SIs of all available two-waveband combinations from hyperspectral data is developed by considering the difference between reflectance values at 760 and 739 nm (DSIR760–R739 = R760 – R739). Among published and newly developed SIs, DSIR760–R739 exhibited a significant and strong linear relationship with LAI and showed outstanding performance in LAI assessments. The permissible bandwidths for broad-band DSIR760–R739 investigated using simulated reflectance were 5 nm for both 760 and 739 nm center wavelengths. The results indicate that the linear regression model based on the narrow-band and broad-band DSIR760–R739 is a simple but accurate method for timely and nondestructive monitoring of LAI.</jats:p>

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