Fatigue and retention in ferroelectric Y-Ba-Cu-O/Pb-Zr-Ti-O/Y-Ba-Cu-O heterostructures
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- R. Ramesh
- Bellcore, Red Bank, New Jersey 07701
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- W. K. Chan
- Bellcore, Red Bank, New Jersey 07701
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- B. Wilkens
- Bellcore, Red Bank, New Jersey 07701
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- H. Gilchrist
- Bellcore, Red Bank, New Jersey 07701
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- T. Sands
- Bellcore, Red Bank, New Jersey 07701
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- J. M. Tarascon
- Bellcore, Red Bank, New Jersey 07701
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- V. G. Keramidas
- Bellcore, Red Bank, New Jersey 07701
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- D. K. Fork
- Xerox Palo Alto Research Center, Palo Alto, California 94305
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- J. Lee
- Rutgers University, Piscataway, New Jersey 08855
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- A. Safari
- Rutgers University, Piscataway, New Jersey 08855
書誌事項
- 公開日
- 1992-09-28
- DOI
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- 10.1063/1.107488
- 公開者
- AIP Publishing
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説明
<jats:p>Fatigue and retention characteristics of ferroelectric lead zirconate titanate thin films grown with Y-Ba-Cu-O(YBCO) thin-film top and bottom electrodes are found to be far superior to those obtained with conventional Pt top electrodes. The heterostructures reported here have been grown in situ by pulsed laser deposition on yttria-stabilized ZrO2 buffer [100] Si and on [001] LaAlO3. Both the a- and c-axis orientations of the YBCO lattice have been used as electrodes. They were prepared using suitable changes in growth conditions.</jats:p>
収録刊行物
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- Applied Physics Letters
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Applied Physics Letters 61 (13), 1537-1539, 1992-09-28
AIP Publishing
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詳細情報 詳細情報について
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- CRID
- 1362825896143854720
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- NII論文ID
- 30015760200
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- NII書誌ID
- AA00543431
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- DOI
- 10.1063/1.107488
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- ISSN
- 10773118
- 00036951
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