Trap Assisted Tunneling and Its Effect on Subthreshold Swing of Tunnel FETs

DOI PDF PDF 4 Citations

Journal

IEEE Transactions on Electron Devices

IEEE Transactions on Electron Devices 63 (11), 4380-4387, 2016-11

Institute of Electrical and Electronics Engineers (IEEE)

Citations (4)*help

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Details 詳細情報について

CRID

1362825896181036800
DOI

10.1109/ted.2016.2603468
ISSN

15579646

00189383
Web Site

http://ieeexplore.ieee.org/ielaam/16/7592488/7562464-aam.pdf

http://xplorestaging.ieee.org/ielx7/16/7592488/07562464.pdf?arnumber=7562464
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