Infrared spectroscopy of pentacene thin film on SiO2 surface

Yoshinobu Hosoi, Koshi Okamura, Yasuo Kimura, Hisao Ishii, Michio Niwano

doi:10.1016/j.apsusc.2004.10.131

Infrared spectroscopy of pentacene thin film on SiO2 surface

DOI Web Site Web Site 被引用文献11件

書誌事項

公開日: 2005-05

権利情報

https://www.elsevier.com/tdm/userlicense/1.0/

DOI

10.1016/j.apsusc.2004.10.131

公開者: Elsevier BV

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説明

Abstract The thin film of pentacene on a SiO2 surface has been investigated by infrared spectroscopy in the multiple internal reflections (MIR) mode. It was found that the molecules in the monolayer are arranged with their molecular axes perpendicular to the surface, and that this arrangement is conserved during film growth up to a 70-nm thickness. In addition, the assignment of the infrared active vibrational modes is discussed.