High-throughput ptychography using Eiger-scanning X-ray nano-imaging of extended regions
Journal
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- Optics Express
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Optics Express 22 (12), 14859-, 2014-06-10
Optica Publishing Group
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Details 詳細情報について
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- CRID
- 1363107368653950336
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- ISSN
- 10944087
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- Data Source
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- Crossref