Automatic processing of rotation diffraction data from crystals of initially unknown symmetry and cell constants
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説明
<jats:p>An algorithm has been developed for the automatic interpretation of a given set of observed reciprocal-lattice points. It extracts a reduced cell and assigns indices to each reflection by a graph-theoretical implementation of the local indexing method. All possible symmetries of the observed lattice compatible with the metric of the reduced cell are recognized and reported, together with the unit-cell constants and the linear index transformation relating the conventional to the reduced cell. This algorithm has been incorporated into the program XDS [Kabsch (1988). <jats:italic>J. Appl. Cryst.</jats:italic> <jats:bold>21</jats:bold>, 916–924], which is now able to process single-crystal area-detector data without prior knowledge of the symmetry and the unit-cell constants.</jats:p>
収録刊行物
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- Journal of Applied Crystallography
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Journal of Applied Crystallography 26 (6), 795-800, 1993-12-01
International Union of Crystallography (IUCr)
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詳細情報 詳細情報について
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- CRID
- 1363107369754895232
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- NII論文ID
- 30019498195
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- ISSN
- 00218898
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- データソース種別
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- CiNii Articles