An on-chip NBTI sensor for measuring PMOS threshold voltage degradation
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- John Keane
- University of Minnesota
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- Tae-Hyoung Kim
- University of Minnesota
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- Chris H. Kim
- University of Minnesota
書誌事項
- 公開日
- 2007-08-27
- 権利情報
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- https://www.acm.org/publications/policies/copyright_policy#Background
- DOI
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- 10.1145/1283780.1283821
- 公開者
- ACM
収録刊行物
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- Proceedings of the 2007 international symposium on Low power electronics and design
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Proceedings of the 2007 international symposium on Low power electronics and design 189-194, 2007-08-27
ACM