Using frequency detuning to improve the sensitivity of electric field measurements via electromagnetically induced transparency and Autler-Townes splitting in Rydberg atoms
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- Matt T. Simons
- National Institute of Standards and Technology (NIST) 1 , Boulder, Colorado 80305, USA
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- Joshua A. Gordon
- National Institute of Standards and Technology (NIST) 1 , Boulder, Colorado 80305, USA
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- Christopher L. Holloway
- National Institute of Standards and Technology (NIST) 1 , Boulder, Colorado 80305, USA
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- David A. Anderson
- University of Michigan 2 Department of Physics, , Ann Arbor, 48109, USA
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- Stephanie A. Miller
- University of Michigan 2 Department of Physics, , Ann Arbor, 48109, USA
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- Georg Raithel
- University of Michigan 2 Department of Physics, , Ann Arbor, 48109, USA
抄録
<jats:p>In this work, we demonstrate an approach for improved sensitivity in weak radio frequency (RF) electric-field strength measurements using Rydberg electromagnetically induced transparency (EIT) in an atomic vapor. This is accomplished by varying the RF frequency around a resonant atomic transition and extrapolating the weak on-resonant field strength from the resulting off-resonant Autler-Townes (AT) splittings. This measurement remains directly traceable to SI compared to previous techniques, precluding any knowledge of experimental parameters such as optical beam powers as is the case when using the curvature of the EIT line shape to measure weak fields. We use this approach to measure weak RF fields at 182 GHz and 208 GHz demonstrating improvement greater than a factor of 2 in the measurement sensitivity compared to on-resonant AT splitting RF electric field measurements.</jats:p>
収録刊行物
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- Applied Physics Letters
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Applied Physics Letters 108 (17), 2016-04-25
AIP Publishing