Origin of the enhanced polarization in La and Mg co-substituted BiFeO3 thin film during the fatigue process

  • Qingqing Ke
    Department of Materials Science and Engineering, National University of Singapore 1 , Singapore 117574
  • Amit Kumar
    Department of Mechanical Engineering, National University of Singapore 2 , Singapore 117576
  • Xiaojie Lou
    Frontier Institute of Science and Techology, Xi'an Jiaotong University 3 , Xi'an 710049, China
  • Kaiyang Zeng
    Department of Mechanical Engineering, National University of Singapore 2 , Singapore 117576
  • John Wang
    Department of Materials Science and Engineering, National University of Singapore 1 , Singapore 117574

書誌事項

公開日
2012-01-23
DOI
  • 10.1063/1.3678636
公開者
AIP Publishing

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説明

<jats:p>We have studied the polarization fatigue of La and Mg co-substituted BiFeO3 thin film, where a polarization peak is observed during the fatigue process. The origin of such anomalous behavior is analyzed on the basis of the defect evolution using temperature-dependent impedance spectroscopy. It shows that the motion of oxygen vacancies (VO••) is associated with a lower energy barrier, accompanied by the injection of electrons into the film during the fatigue process. A qualitative model is proposed to explain the fatigue behavior, which involves the modification of the Schottky barrier upon the accumulation of VO•• at the metal-dielectric interface.</jats:p>

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