DETECTION OF DEFECTS ON SELECTED APPLE CULTIVARS USING HYPERSPECTRAL AND MULTISPECTRAL IMAGE ANALYSIS

詳細情報 詳細情報について

• CRID

  1363388843783155456

• DOI

  10.13031/2013.7790

• ISSN

  19437838

• Web Site

  http://elibrary.asabe.org/azdez.asp?JID=3&AID=7790&t=2&v=18&i=2&CID=aeaj2002&redir=aid=7790&redir=%5Bconfid=aeaj2002%5D&redirType=&downPDF=Y&directPDF=Y

• データソース種別

  • Crossref