Strategy for designing accelerated aging tests to evaluate IGBT power modules lifetime in real operation mode
書誌事項
- 公開日
- 2003-06
- 権利情報
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- https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html
- DOI
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- 10.1109/tcapt.2003.815112
- 公開者
- Institute of Electrical and Electronics Engineers (IEEE)
この論文をさがす
収録刊行物
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- IEEE Transactions on Components and Packaging Technologies
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IEEE Transactions on Components and Packaging Technologies 26 (2), 429-438, 2003-06
Institute of Electrical and Electronics Engineers (IEEE)