Simultaneous parameter estimation and segmentation of Gibbs random fields using simulated annealing
書誌事項
- 公開日
- 1989
- 権利情報
-
- https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html
- DOI
-
- 10.1109/34.31443
- 公開者
- Institute of Electrical and Electronics Engineers (IEEE)
この論文をさがす
収録刊行物
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- IEEE Transactions on Pattern Analysis and Machine Intelligence
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IEEE Transactions on Pattern Analysis and Machine Intelligence 11 (8), 799-813, 1989
Institute of Electrical and Electronics Engineers (IEEE)
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詳細情報 詳細情報について
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- CRID
- 1363388845198593152
-
- NII論文ID
- 30019769888
-
- DOI
- 10.1109/34.31443
-
- ISSN
- 01628828
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- データソース種別
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- Crossref
- CiNii Articles
