Review of Hybrid Prognostics Approaches for Remaining Useful Life Prediction of Engineered Systems, and an Application to Battery Life Prediction

DOI PDF 1 Citations

Journal

IEEE Transactions on Reliability

IEEE Transactions on Reliability 63 (1), 191-207, 2014-03

Institute of Electrical and Electronics Engineers (IEEE)

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Details 詳細情報について

CRID

1363388845534050176
DOI

10.1109/tr.2014.2299152
ISSN

15581721

00189529
Web Site

http://xplorestaging.ieee.org/ielx7/24/6750070/06712934.pdf?arnumber=6712934
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