Argon gas, by near-ambient pressure XPS

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  • Dhananjay I. Patel
    Department of Chemistry and Biochemistry, Brigham Young University 1 , C100 BNSN, Provo, Utah 84602
  • Stephan Bahr
    SPECS Surface Nano Analysis GmbH 2 , Voltastrasse 5, 13355 Berlin, Germany
  • Paul Dietrich
    SPECS Surface Nano Analysis GmbH 2 , Voltastrasse 5, 13355 Berlin, Germany
  • Michael Meyer
    SPECS Surface Nano Analysis GmbH 2 , Voltastrasse 5, 13355 Berlin, Germany
  • Andreas Thißen
    SPECS Surface Nano Analysis GmbH 2 , Voltastrasse 5, 13355 Berlin, Germany
  • Matthew R. Linford
    Department of Chemistry and Biochemistry, Brigham Young University 1 , C100 BNSN, Provo, Utah 84602

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<jats:p>Near-ambient pressure–x-ray photoelectron spectroscopy (NAP-XPS) is a less traditional form of XPS that allows samples to be analyzed at relatively high pressures, i.e., greater than 2500 Pa. With NAP-XPS, XPS can analyze moderately volatile liquids, biological samples, porous materials, and/or polymeric materials that outgas significantly. In this submission, we show survey, 2s, 2p, 3s, 3p, and the Auger LMM NAP-XPS spectra from argon gas, a material that could not be analyzed at moderate pressures by conventional methods. A small N 1s signal from residual nitrogen gas in the chamber is also present in the survey spectrum.</jats:p>

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